Versatile test pattern generator capable of producing a range of test patterns in standard ITU-R BT.656 format. The module is ideal for use in the prototyping stages of digital video systems or as a ...

We achieve this by running bidirectional logic and memory test patterns on each device, ensuring accurate burning conditions and traceability, including reading device IDs and on wafer temperature ...

They concluded that the results constitute “the first empirical evidence that any artificial system passes a standard three-party Turing test ... historical trade patterns and real-time ...